Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron
Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics
of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography,
image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing
methods used in all these domains.